NTCIR-13 Conference

The 8th International Workshop on Evaluating Information Access (EVIA 2017)

EVIA 2017

The Eighth International Workshop on Evaluating Information Access (EVIA 2017),
a Satellite Workshop of the NTCIR-13 Conference
December 5, 2017 at National Institute of Informatics, Tokyo, Japan.


EVIA 2017 Online Proceedings (released Nov 30, 2017)

EVIA 2017 Program -NTCIR-13 DAY-1- (Dec 05, 2017)




EVIA 2017 CALL FOR PAPERS   Submission Instructions   Important Dates   Past EVIAs   EVIA 2017 Program Committee

EVIA 2017 CALL FOR PAPERS

We invite submissions for the Eighth International Workshop on Evaluating Information Access (EVIA 2017) which will be held in conjunction with NTCIR 13 in Tokyo, Japan, on December 5, 2017. Information Access technologies provide the interface between human information needs and digital information resources. The reliable evaluation of these technologies has been recognized for decades as central to the advancement of the field. As information retrieval technologies become more pervasive, the forms of retrieval more diverse, and retrieval tools richer, the importance of effective, efficient, and innovative evaluation grows as well.

We invite both short papers (2-4 pages) and long papers (8-10 pages) addressing one or more of the following topics, as well as any other topic related to the evaluation of information access:

- Test collection formation, evaluation metrics, and evaluation environments
- Statistical issues in information retrieval evaluation
- User studies and the evaluation of human-computer interaction in information retrieval (HCIR)
- Evaluation methods for multilingual, multimedia, or mobile information access
- Novel information access tasks and their evaluation
- Evaluation and assessment using implicit user feedback, crowdsourcing, living labs, or inferential methods
- Evaluation issues in industrial and enterprise retrieval systems
- Reproducibility issues in information retrieval evaluation

Submissions must be in English, in PDF format, and must use standard ACM SIGIR templates, which are available for both LaTeX and Word from the ACM website. Papers must report work that is not previously published, not accepted for publication elsewhere, and not currently under review elsewhere. Submissions should not contain any author identification and should be submitted electronically via the conference submission system.

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SUBMISSION INSTRUCTIONS

Submissions will be subject to double-blind reviewing. Accepted papers will be included in the EVIA 2017 proceedings in the CEUR Workshop Proceedings (CEUR-WS.org) series, indexed by DBLP, Google Scholar, Scopus and others.

We invite submissions of regular papers (up to 8-10 pages) and short papers (up to 4 pages). Submissions must be in English, in PDF format, and must use standard ACM SIGIR templates.

Submissions must be made through the conference submission system.

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IMPORTANT DATES for EVIA 2017

*Deadline time is 11:59 p.m. (anywhere in the world).*
Oct. 13, 2017
Submission deadline*(extended)
Nov. 7, 2017
Notifications to authors*
Nov. 17, 2017
Camera ready due*
Dec. 5, 2017
EVIA 2017 @NII, Tokyo, Japan
Dec. 6-8, 2017
NTCIR-13 @NII, Tokyo, Japan

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PAST EVIAs

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EVIA 2017 PROGRAM COMMITTEE

  • Nicola FerroUniversity of Padua, Italy (Co-Chair)

  • Ian SoboroffNational Institute of Standards and Technology (NIST), USA (Co-Chair)

  • Hsin-Hsi ChenNational Taiwan University, Taiwan

  • Charles ClarkeUniversity of Waterloo, Canada

  • Atsushi FujiiTokyo Institute of Technology, Japan

  • Donna HarmanNational Institute of Standards and Technology (NIST), USA

  • Gareth JonesDublin City University, Ireland

  • Noriko KandoNational Institute of Informatics, Japan

  • Evangelos KanoulasUniversity of Amsterdam, The Netherlands

  • Aldo LipaniVienna University of Technology, Austria

  • Claudio LuccheseCa' Foscari University of Venice and ISTI CNR Pisa, Italy

  • Maria MaistroUniversity of Padua, Italy

  • Stefano MizzaroUniversity of Udine, Italy

  • Alistair MoffatUniversity of Melbourne, Australia

  • Shahzad RajputNational Institute of Standards and Technology (NIST), USA

  • Tetsuya SakaiWaseda University, Japan

  • Mark SandersonRMIT University, Australia

  • Falk ScholerRMIT University, Australia

  • Mark SmuckerUniversity of Waterloo, Canada

Last Modified: 2017-11-24